编辑: 雨林姑娘 | 2015-05-13 |
41 No.3 2019年3月Infrared Technology Mar.
2019 208? 〈材料与器件〉 超精密车削单晶锗表面性能分析 石广丰,韩冬冬,史国权,付旺,王淑坤,张华,刘思宇 (长春理工大学 机电工程学院,长春 130022) 摘要:单晶锗是典型的红外光学晶体材料,其加工表面的评价方法大都局限于面形精度,而加工过程 所产生的位错及晶面间距变化也会影响单晶锗的使用性能.为了全面地评价单晶锗加工后的表面性 能,通过表面粗糙度轮廓仪、X 射线衍射仪等设备,对超精密车削的单晶锗平面及曲面进行了表面粗 糙度和 X 射线检测, 获得了针对单晶锗平面的表面粗糙度与位错密度相结合的性能评价方法, 及针对 单晶锗曲面的表面粗糙度与晶面间距变化程度相结合的性能评价方法. 相关研究对单晶锗在红外光学 及其它领域的加工应用有重要意义. 关键词:单晶锗;
X 射线;
摇摆曲线;
晶面间距 中图分类号:TG51 文献标识码:A 文章编号:1001-8891(2019)03-0208-06 Surface Performance Analysis of Ultra-precision Turning Single Crystal Germanium SHI Guangfeng,HAN Dongdong,SHI Guoquan,FU Wang,WANG Shukun,ZHANG Hua,LIU Siyu (School of Mechanical and Electrical Engineering Changchun University of Science and Technology, Changchun 103322, China) Abstract:Single-crystal germanium is a typical infrared optical crystal material. The evaluation methods of the processed surface are mostly focus on the surface accuracy, but the performance of single-crystal germanium can be affected by the dislocations generated in the processing and variation of the crystal plane spacing. In order to comprehensively evaluate the processed surface properties of single-crystal germanium, surface roughness and X-ray inspection of ultra-precision turned single-crystal planes and curved surfaces were carried out by means of a surface roughness measuring instrument, X-ray diffractometer, etc. Performance evaluation method for combining the surface roughness and dislocation density of single-crystal germanium plane and that for combining surface roughness and percentage change incrystal plane spacing of single-crystal germanium curved surface are obtained. Related research is of great significance for the processing of single-crystal germanium in infrared optics and other fields. Key words:single crystal germanium,X-ray,rocking curve,interplanar spacing
0 引言 单晶锗是一种重要的红外晶体材料,在红外光 学、航空航天测控、核物理探测、光纤通信等领域都 有广泛的应用.但是由于其具有高脆性、易碎、硬度 高、断裂韧性低和各向异性的特征,传统的加工方法 很难保证切削后单晶锗表面质量,必须要用超精密 加工技术.单点金刚石切削以其高效率、高精度的优 点常被用做单晶锗的最有效加工方法[1-4] . 单晶锗的超 精密切削加工主要有塑性滑移变形去除和脆性解理 断裂去除两种.材料的去除方式不同会导致单晶锗的 加工面呈现出不同的形貌,且表面粗糙度受单晶锗各 向异性的影响呈扇形分布[5] .刀具对单晶锗作用的外 力会引发单晶锗发生位错运动,而位错的存在会对单 晶锗的加工以及使用产生负面的影响[6-7] . X 射线摇摆曲线被广泛应用于晶体的微观缺陷研 究[8-9] . 单晶体内的位错密度与摇摆曲线的半峰宽数值 上成正比变化,因此可以用单晶锗摇摆曲线半峰宽的 收稿日期:2018-06-06;