PDF《LM35 高精度摄氏温度传感器》

4 30 V (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. (2) For additional thermal resistance information, see Typical Application. 6.4 Thermal Information THERMAL METRIC(1)(2) LM35 UNIT NDV LP D NEB

3 PINS

8 PINS

3 PINS RθJA Junction-to-ambient thermal resistance

400 180

220 90 °C/W RθJC(top) Junction-to-case (top) thermal resistance

24 ― ― ―

5 LM35 www.ti.com.cn ZHCSHC4H CAUGUST 1999CREVISED DECEMBER

2017 Copyright ? 1999C2017, Texas Instruments Incorporated (1) Tested Limits are ensured and 100% tested in production. (2) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (3) Accuracy is defined as the error between the output voltage and

10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. (6) Quiescent current is defined in the circuit of Figure 14. 6.5 Electrical Characteristics: LM35A, LM35CA Limits Unless otherwise noted, these specifications apply: ?55°C ≤ TJ ≤ 150°C for the LM35 and LM35A;

?40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA;

and 0°C ≤ TJ ≤ 100°C for the LM35D. VS =

5 Vdc and ILOAD =

50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14. PARAMETER TEST CONDITIONS LM35A LM35CA UNIT TYP TESTED LIMIT(1) DESIGN LIMIT(2) TYP TESTED LIMIT(1) DESIGN LIMIT(2) Accuracy(3) TA = 25°C ±0.2 ±0.5 ±0.2 ±0.5 °C TA = C10°C ±0.3 ±0.3 ±1 TA = TMAX ±0.4 ±1 ±0.4 ±1 TA = TMIN ±0.4 ±1 ±0.4 ±1.5 Nonlinearity(4) TMIN ≤ TA ≤ TMAX, C40°C ≤ TJ ≤ 125°C ±0.18 ±0.35 ±0.15 ±0.3 °C Sensor gain (average slope) TMIN ≤ TA ≤ TMAX

10 9.9

10 9.9 mV/°C C40°C ≤ TJ ≤ 125°C

10 10.1

10 10.1 Load regulation(5)

0 ≤ IL ≤

1 mA TA = 25°C ±0.4 ±1 ±0.4 ±1 mV/mA TMIN ≤ TA ≤ TMAX, C40°C ≤ TJ ≤ 125°C ±0.5 ±3 ±0.5 ±3 Line regulation(5) TA = 25°C ±0.01 ±0.05 ±0.01 ±0.05 mV/V

4 V ≤ VS ≤

30 V, C40°C ≤ TJ ≤ 125°C ±0.02 ±0.1 ±0.02 ±0.1 Quiescent current(6) VS =

5 V, 25°C

56 67

56 67 ?A VS =

5 V, C40°C ≤ TJ ≤ 125°C

105 131

91 114 VS =

30 V, 25°C 56.2

68 56.2

68 VS =

30 V, C40°C ≤ TJ ≤ 125°C 105.5

133 91.5

116 Change of quiescent current(5)

4 V ≤ VS ≤

30 V, 25°C 0.2

1 0.2

1 ?A

4 V ≤ VS ≤

30 V, C40°C ≤ TJ ≤ 125°C 0.5

2 0.5

2 Temperature coefficient of quiescent current C40°C ≤ TJ ≤ 125°C 0.39 0.5 0.39 0.5 ?A/°C Minimum temperature for rate accuracy In circuit of Figure 14, IL =

0 1.5

2 1.5

2 °C Long term stability TJ = TMAX, for

1000 hours ±0.08 ±0.08 °C

6 LM35 ZHCSHC4H CAUGUST 1999CREVISED DECEMBER

2017 www.ti.com.cn Copyright ? 1999C2017, Texas Instruments Incorporated (1) Accuracy is defined as the error between the output voltage and

10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (2) Tested Limits are ensured and 100% tested in production. (3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating e........