PDF《MCP3204/3208》

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2008 Microchip Technology Inc. TEMPERATURE CHARACTERISTICS FIGURE 1-1: Serial Interface Timing. Electrical Specifications: Unless otherwise indicated, VDD = 5V, VSS = 0V, VREF = 5V Parameters Sym Min Typ Max Units Conditions Temperature Ranges Specified Temperature Range TA -40 ― +125 °C Operating Temperature Range TA -40 ― +125 °C Storage Temperature Range TA -65 ― +150 °C Thermal Package Resistances Thermal Resistance, 14L-PDIP θJA ―

70 ― °C/W Thermal Resistance, 14L-SOIC θJA ― 95.3 ― °C/W Thermal Resistance, 14L-TSSOP θJA ―

100 ― °C/W Thermal Resistance, 16L-PDIP θJA ―

70 ― °C/W Thermal Resistance, 16L-SOIC θJA ― 86.1 ― °C/W CS CLK DIN MSB IN tSU tHD tSUCS tCSH tHI tLO DOUT tEN tDO tR tF LSB MSB OUT tDIS Null Bit ?

2008 Microchip Technology Inc. DS21298E-page

5 MCP3204/3208 FIGURE 1-2: Load Circuit for tR, tF, tDO. FIGURE 1-3: Load circuit for tDIS and tEN. Test Point 1.4V DOUT

3 k? CL =

100 pF DOUT tR Voltage Waveforms for tR, tF CLK DOUT tDO Voltage Waveforms for tDO tF VOH VOL 90% 10% * Waveform

1 is for an output with internal conditions such that the output is high, unless disabled by the output control. ? Waveform

2 is for an output with internal conditions such that the output is low, unless disabled by the output control. Test Point DOUT

3 k?

100 pF tDIS Waveform

2 tDIS Waveform

1 CS CLK DOUT tEN

1 2 B11 Voltage Waveforms for tEN tEN Waveform VDD VDD/2 VSS

3 4 Voltage Waveforms for tDIS DOUT DOUT CS VIH TDIS Waveform 1* Waveform 2? MCP3204/3208 DS21298E-page

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2008 Microchip Technology Inc. NOTES: ?

2008 Microchip Technology Inc. DS21298E-page

7 MCP3204/3208 2.0 TYPICAL PERFORMANCE CHARACTERISTICS Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE =

100 ksps, fCLK = 20* fSAMPLE, TA = +25°C. FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample Rate. FIGURE 2-2: Integral Nonlinearity (INL) vs. VREF . FIGURE 2-3: Integral Nonlinearity (INL) vs. Code (Representative Part). FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample Rate (VDD = 2.7V). FIGURE 2-5: Integral Nonlinearity (INL) vs. VREF (VDD = 2.7V). FIGURE 2-6: Integral Nonlinearity (INL) vs. Code (Representative Part, VDD = 2.7V). Note: The graphs and tables provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0

0 25

50 75

100 125

150 Sample Rate (ksps) INL (LSB) Positive INL Negative INL -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 2.5

0 1

2 3

4 5 VREF (V) INL (LSB) Positive INL Negative INL -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0

0 512

1024 1536

2048 2560

3072 3584

4096 Digital Code INL (LSB) -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0

0 10

20 30

40 50

60 70

80 Sample Rate (ksps) INL (LSB) Positive INL Negative INL VDD = VREF = 2.7 V -2.0 -1.5 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 VREF (V) INL (LSB) Positive INL Negative INL -1.0 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8 1.0

0 512

1024 1536

2048 2560

3072 3584

4096 Digital Code INL (LSB) VDD = VREF = 2.7 V FSAMPLE =

50 ksps MCP3204/3208 DS21298E-page

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2008 Microchip Technology Inc. Note: Unless otherwise indicated, VDD = VREF =