PDF《AEC-Q100, Q101, Q200》

48 hours at 150°C or

24 hours at 175°C Grade 1:

48 hours at 125°C or

24 hours at 150°C Grade 2:

48 hours at 105°C or

24 hours at 125°C Grade 3:

48 hours at 85°C or

24 hours at 105°C Grade 4:

48 hours at 70°C or

24 hours at 90°C AEC-Q100 温湿度试验条件整理: www.prisemi.com 1.2.1 Military MIL-STD-750 Test Methods for Semiconductor Devices 1.2.2 Industrial UL-STD-94 Test for Flammability of Plastic Materials of Parts in Devices and Appliances. JEDEC JESD-22 Reliability Test Methods for Packaged Devices J-STD-002 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires. J-STD-020 Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices JESD22-A113 Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing J-STD-035 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components 1.2.3 Automotive AEC-Q001 Guidelines for Part Average Testing AEC-Q005 Pb-Free Test Requirements AEC-Q101-001 ESD (Human Body Model) AEC-Q101-003 Discrete Component Wirebond Shear Test AEC-Q101-004 Miscellaneous Test Methods ? Unclamped Inductive Switching;

? Dielectric Integrity;

? Destructive Physical Analysis AEC-Q101-005 ESD (Charged Device Model) AEC-Q101-006 Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems 1.2.4 Other QS-9000;

ISO-TS-16949 www.prisemi.com AEC - Q003 IC Characterization www.prisemi.com AEC - Q003 IC Characterization www.prisemi.com AEC - Q003 IC Characterization Corners Across

3 Temperatures www.prisemi.com SYL1 = Mean -

3 Sigma SBL1 = Mean +

3 Sigma SYL2 = Mean -

4 Sigma SBL2 = Mean +

4 Sigma AEC - Q002 Statistical Yield Analysis Hold for Eng-Review Hold for Risk Assessment www.prisemi.com AEC - Q004 DRAFT Zero Defect www.prisemi.com THANKS ........